CATALOG / SEMICONDUCTOR EQUIPMENT / USA

Semiconductor Equipment made in USA

140 curated semiconductor equipment products with USA as country of origin, spanning 64 categories and 21 brands. Part of the MPBxChange global sourcing catalog.

Curated catalog of public products — not suppliers who have joined MPBx.

140
PRODUCTS
64
CATEGORIES
21
BRANDS

SEMICONDUCTOR EQUIPMENT · USA · 140 PRODUCTS

BRANDPRODUCTCATEGORY
Applied MaterialsEndura 5500, Endura 2, Endura HTPVD
Lam ResearchAltus, Vector PVDPVD
Veeco (CVC)Explorer, BenchmarkPVD
Applied MaterialsEndura iPVDPVD
Applied MaterialsEndura II, Endura TXZPVD
Applied MaterialsProducer GT, Producer SE, Producer CCVD
Lam ResearchVector Express, Vector Excel, Vector ExtremeCVD
Applied MaterialsProducer HARPCVD
Applied MaterialsProducer BPSG, Producer TEOSCVD
VeecoK465i, MaxBright M, MaxBright MHP, EPIK 700CVD
VeecoPropel, Propel HVM, Propel 300mmCVD
Applied MaterialsOlympia ALD, Centura ALDALD
Lam ResearchVector ALD, Altus ALDALD
Applied MaterialsRaider ECD, Endura ECD, Sabre 3DECD
Lam ResearchSABRE 3D, Triton ECDECD
Applied MaterialsNokota ECD (300mm panel)ECD
VeecoPropel HVM, Propel 300mm, K465iEpitaxy
Veeco (RIBER)GEN200, GEN930, K475Epitaxy
Applied MaterialsCentura Epi, Epi XPEpitaxy
Lam Research2300 Flex Series (D,E,F,G,H), Exelan FlexDry Etch
Lam Research2300 Kiyo Series (C,E,F,G), Versys Kiyo45Dry Etch
Applied MaterialsCentura DPS II, Centura AdvantEdge, Producer EtchDry Etch
Lam Research2300 Versys Metal (L,M,N series)Dry Etch
Lam Research2300 Syndion, Syndion-CDry Etch
Lam Research2300 SelisDry Etch
Lam ResearchFlex ALE (AMMP), Kiyo ALEALE
Applied MaterialsCentura ALE, Producer ALEALE
Applied MaterialsReflexion LK, Reflexion GT, Reflexion GTCCMP Polishing
Applied MaterialsReflexion GTCCMP Polishing
Kinetics (KLA)iSurf, 3200MCMP Polishing
Lam ResearchDV-Prime, Da Vinci, EOSCMP Cleaning
Lam ResearchDa Vinci, DV-Prime, EOS, SP SeriesSingle Wafer Clean
Lam ResearchGAMMA Series (GAMMA 2100, 3100)Resist Strip
Lam ResearchSP Series, Da VinciResist Strip
Applied MaterialsVantage Radiance, Vantage RadOx, Vantage VulcanRTP
Applied MaterialsVantage Astra, Vantage Astra DLARTP
Applied MaterialsRadiance CenturaRTP
Coherent (Applied Materials)Vantage Astra DLALaser Anneal
Applied MaterialsCentura Epi, Epi XP, RP EpiEpitaxy
Applied MaterialsVIISta Trident, VIISta HCP, VIISta HCRHigh Current
AxcelisPurion H6, Purion H, Purion H200, Purion DragonHigh Current
Applied MaterialsVIISta 900XP, SwiftMedium Current
AxcelisPurion M, Purion M+ SiCMedium Current
AxcelisPurion XE, EXE, VXE, XEmaxHigh Energy
Applied MaterialsVIISta 3000XP, VIISta MeV Light IonHigh Energy
Applied MaterialsVIISta PLAD, VIISta PLAD HTPlasma Doping
AxcelisPurion XE Power Series+MeV Implanter
Applied MaterialsVIISta MeV Light IonMeV Implanter
AxcelisPurion H200+ SiC, Purion M+ SiC, XE+ SiCSpecialty
KLA3935, 3920 EPBright-Field
KLA2965, 2950 EPBright-Field
KLA2930 Series (2935)Bright-Field
KLA2800, 283x SeriesBright-Field
KLA8920Bright-Field
KLAVoyager 1015Bright-Field
KLAPuma 9980Dark-Field
KLAPuma 9150, 9130, 9110Dark-Field
KLAMulti-modeDark-Field
KLASurfscan SP7Unpatterned
KLASurfscan SP5XPUnpatterned
KLASurfscan SP3Unpatterned
KLASurfscan SP1, SP2Unpatterned
KLAeSL10Single-Beam
Applied MaterialsPROVisionSingle-Beam
KLAPROVision X10Multi-Beam
Applied MaterialseVision HybridHybrid
Applied MaterialsVeritySEM 10High-Resolution
KLAArcher 750, Archer 600DBO/Scatterometry
KLAArcher 500LCMDBO/Scatterometry
KLAArcher 500LCM (IBO mode)IBO
Onto InnovationJetStep X500 Firefly G3Packaging
KLAAleris 9350SE + Reflectometry
KLAAleris 8500SE + Reflectometry
KLAAleris 8350SE + Reflectometry
KLAAleris 8310SE + Reflectometry
Onto InnovationAtlas G6OCD + SE
Onto InnovationAtlas VOCD + SE
Onto InnovationAtlas III+OCD + SE
Onto InnovationAspectIR OCD
NovaT600SE
NovaT500, NovaScan 3090NextSE
NovaHelioSense T100SE
NovaV2600Reflectometry
Onto InnovationIris S, Iris G2SE + Reflectometry
Onto InnovationIMPULSE V, IMPULSE+Reflectometry
KLASpectraFilm LD10Reflectometry
NovaXPS-based metrologyXPS
KLAPWG5 (Patterned Wafer Geometry)Wafer Geometry
KLAWaferSight PWG2Wafer Geometry
KLATherma-Probe 780Implant Metrology
KLATherma-Probe 680XPImplant Metrology
Bruker (KLA)Dektak XTL, Dektak ProStylus Profiler
Bruker (KLA)DektakXTStylus Profiler
KLA (Filmetrics)Profilm3D, ZetaOptical Profiler
KLA (Filmetrics)R50, R54Sheet Resistance
KLAeDR7380SEM Review
KLAeDR7280SEM Review
Applied MaterialsSEMVisionSEM Review
KLACIRCL5 (Micro module)Optical Review
Onto InnovationFirefly G3Optical Review
Onto InnovationDragonfly G3Optical Review
KeysightB1500AParameter Analyzer
KeysightB1505AParameter Analyzer
KLACIRCL5Multi-Surface
KLACV350 (in CIRCL5)Edge Inspection
KLABDR300 (in CIRCL5)Backside
KLA2401Macro
Onto Innovation (Rudolph)NSX 320Macro
Onto Innovation (Rudolph)NSX 220Macro
TeradyneUltraFLEXplus, UltraPin2200SoC/Logic
CohuDiamondx, DxVSoC/Logic
TeradyneUltraFLEXplus UltraWave24GRF
CohuDiamondx RedDragon RFRF
CohuDiamondx PMVIx, FPVIxAnalog
CohuDiamondx DCTMxMixed-Signal
FormFactorSummit 12000, CM300xiProbe Station
FormFactorVector, TouchdownProbe Card
CohuMT9928 XMGravity Feed
CohuMT9510 XP/x16Pick-and-Place
CohuDelta MATRiXPick-and-Place
TeradyneTitan HPSystem Level Test
KeysightM9484C VXG (+V3080A)Vector Signal Generator
KeysightN9042B UXASpectrum Analyzer
Kulicke & SoffaRAPID ProBall Bonder
Kulicke & SoffaAPEX seriesBall Bonder
Kulicke & Soffa4522Ball Bonder
K&SAsterionWedge Bonder
K&SAsterion EV/SVWedge Bonder
CohuEclipsePick-and-Place
CohuMATRiXPick-and-Place
CohuMT9510 XP / x16Pick-and-Place
CohuVarious gravity handlersGravity Feed
CohuVarious turret handlersTurret-Based
CohuMEMS test solutionsPick-and-Place
CohuDedicated WLCSP handlerPick-and-Place
Nordson Dage4000PlusBond Test
Nordson DageXD7600NT Diamond FPX-Ray
Nordson DageXD7600NT RubyX-Ray
Nordson DageQUADRA 7 ProX-Ray
CohuIntegrated taping solutionsTape & Reel

SEMICONDUCTOR EQUIPMENT BY OTHER COUNTRIES

Japan · 77Netherlands · 24Israel · 17Germany · 7South Korea · 6Hong Kong · 5